Six Sigma Producibility Analysis and Process CharacterizationAddison-Wesley, 1992 - Всего страниц: 160 This definitive book provides the core measurement tools that Motorola, winner of the 1988 Malcolm Baldridge National Quality Award, uses to consistently produce high-calibre products as part of their drive to attain Six Sigma Quality--only 3.4 defects per million opportunities for error. Producibility Analysis and Process Characterization are groundbreaking engineering and statistical techniques for determining the probability that each manufacturing process will always yield identical products with zero defects. |
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... University , Tempe , Arizona . Kenneth Chase , Ph.D. , Professor of Engineering , Mechanical Engineering Department , Brigham Young University , Provo , Utah . Vijay A. Tipnis , Sc.D. , Professor ; and Morris M. Bryan , Jr. Chair for ...
... University , Tempe , Arizona . Kenneth Chase , Ph.D. , Professor of Engineering , Mechanical Engineering Department , Brigham Young University , Provo , Utah . Vijay A. Tipnis , Sc.D. , Professor ; and Morris M. Bryan , Jr. Chair for ...
Стр. 3
... University Press . Daniel , C. ( 1976 ) . Applications of Statistics To Industrial Experimentation . New York : John Wiley and Sons . Guenther , W. ( 1973 ) . Concepts of Statistical Interference . New York : McGraw - Hill Book Co ...
... University Press . Daniel , C. ( 1976 ) . Applications of Statistics To Industrial Experimentation . New York : John Wiley and Sons . Guenther , W. ( 1973 ) . Concepts of Statistical Interference . New York : McGraw - Hill Book Co ...
Стр.
... mean shift vector , 6-17 Y Y grind method , 8-8 Ꮓ Z distribution , 5-14 Z transform , 5-10 , 5-11 , 5-13 Z transformation , 5-9 Zero defects , 2-8 Numbers 6 sigma , 5-2 11 440AA PS 10/92 02-013-01 6121 * 1 089 UNIVERSITY Index - 5.
... mean shift vector , 6-17 Y Y grind method , 8-8 Ꮓ Z distribution , 5-14 Z transform , 5-10 , 5-11 , 5-13 Z transformation , 5-9 Zero defects , 2-8 Numbers 6 sigma , 5-2 11 440AA PS 10/92 02-013-01 6121 * 1 089 UNIVERSITY Index - 5.
Содержание
PROCESS CHARACTERIZATION | 4-1 |
SECTION | 5-1 |
The Theoretical Basis for Characterization Metrics | 5-6 |
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Часто встречающиеся слова и выражения
applied arithmetic mean assembly gap booklet calculated capability ratio chart CJ/RF computed consider control chart DATA COLLECTION SYSTEM defined Design for Manufacturability discussion dynamic mean engineering equivalent error estimate example experimental Figure first-time yield given grind method Hence instance intelligent area interval likelihood limiting standard normal long-term capability mean behavior mean shift measurement metrics Motorola Multi-Vari Study nonconformance nonrandom normal curve normal distribution number of defects optimization parameter capability percent performance PHASE Poisson Poisson distribution population Printed Circuit Boards probability process characterization random rational subgroups reader recognize response characteristic response parameters robustness rolled-throughput yield sample short-term capability Six Sigma standard deviation standard normal deviate statistical Statistical Process Control Step SYSTEM RF/JG tail area term through-hole tion tolerance total number unit of product variance Y₁ Z scale zero defects